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Fast and Accurate Statistical Cell Characterization
Cell model creation for statistical timing analysis
Practical Applications of Statistical Static Timing Analysis
Variability fingered as next design pothole
On-chip variation and timing closure
Leakage takes priority at 65nm
Variability upends designers' plans

Altos is an EDA company that provides ultra fast characterization technology to address key nanometer challenges such as low power, yield and process variation.

2008 Press Releases

07.28.08 Altos Variety LX Adopted by STMicroelectronics for ultra-fast Corner and Statistical Characterization at 40nm
06.09.08 Altos Releases Variety LX to enable ultra-fast Corner and Statistical Characterization for 45nm and below
06.05.08 Altos Statistical Timing Models Proven on UMC's 65nm Process
06.03.08 Altos Cell Characterization Tools Used for TSMC's 40nm Libraries

2007 Press Releases

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Altos Design Automation Inc.